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Journals   A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Electronic Product Reliability and Environmental Testing
1672-5468
2009 Issue 1
Two Concepts for Quality Assurance in the Military Standards
JIN Yu-quan;HUANG Yu-ying;ZHANG Hong
..............page:1-3
The Optimized Plan for Accelerated Life Testing of Electronic Products
PENG Qiu-shi
..............page:4-8
Reliability Analysis Based on Circuit Board Accelerated Degradation Data
WANG Yu-ming;CAI Jin-yan
..............page:9-12
Moment Estimation of the Two-parameter Weibull Distribution Under Multiply Type-I
TIAN Ting;LIU Ci-hua
..............page:13-15
MML Method and its Application in the Reliability Analysis of Navigating System
FO Xian-chao;XIONG Hai-lin
..............page:16-19
Overview of Artificial Accelerated Light Aging Test Methods
WANG Chun-chuan
..............page:65-69
ke kao xing yu huan jing shi ying xing biao zhun xin xi yu xing ye dong tai
..............page:3,19,22,31,36,42,47,52,55,64,69,70-71
zheng gao qi shi
..............page:72
tou gao xu zhi
..............page:73
Study on the Application of the Environmental Factor in the Reliability Evaluation of Electronic Products
ZHEN Xin
..............page:20-22
Fuzzy Evaluation Approach on Risk of Reliability Programs for Weapon Equipment Development
GUAN Zi-ming;CHANG Wen-bing
..............page:23-27
Study on the Parameter Degradation of Silicon Microwave Pulsed Power Transistor
PAN Jin-hui;LAI Ping;LI Bin;LIAO Chao
..............page:28-31
Analysis on Short-circuit Failure Mechanisms of Transient Voltage Suppressor
LI Ming-xiu;JIA Ying;CHEN Kai
..............page:32-36
Finite Element Analysis for Temperature-stress Coupled Field of the PCB
JIANG Qing-long;HU Zhi-gang
..............page:37-42
Thermal Analysis of Beam Lead PIN Diode for Microwave Modules
XIE Guo-xiong;LAI Ping;WANG Xue-song;SONG Fang-fang;WANG Ren;DAI Hai-feng
..............page:43-47
Analysis of Thermal Stress On RF MLCC
FU Xing-zhong;RONG Yi-mei;HUANG Chao;DAI Qiang
..............page:48-52
Analysis and Simulation of Reliability Re-allocation of System with the Dynamic-design Method
WEI Xuan-ping;YAO Min-li;ZHANG Zhou-sheng
..............page:53-55
Thermal Analysis of Outdoor Base Station RRU
ZHOU Ai-lan;ZHAO Ji-zhe
..............page:56-61
Verification of Software Testing Environment for Phased-array Radar
WANG Qiang
..............page:62-64
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