Electronic Product Reliability and Environmental Testing 2005 Issue 1 suo yue biao

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Electronic Product Reliability and Environmental Testing
1672-5468
2005 Issue 1

suo yue biao

..............page:插页

ke xue jia shi yan pen shui leng que xin pian de xin ji shu

..............page:74

zhong guo wapi biao zhun you wang cheng wei guo ji biao zhun

..............page:65

WLAN: free from cable
XIA Wei

..............page:50-53

Introduction of the guard against theft and monitor system
LI Che;LI Ji-yun

..............page:54-58

Reliability prediction for a product with optic-mechano-electronic components
LI Pei-ji

..............page:59-62

Problem concerning reliability allocation and its solution
ZHANG Sheng-yan

..............page:63-65

How to run the quality management system continuously and effectively
WANG Li;ZHANG Zhe;WANG Jing

..............page:66-68

6σ management strategy--the way for pursuing the world-class quality
YUAN Jun

..............page:69-74

Model of quality management in electronic companies
CHEN Yi-shun;CHEN Juan;CHEN Wei-feng

..............page:75-77

Electrc insulating materials and safety
QIU Ling

..............page:78-79

dian zi chan pin ke kao xing yu huan jing shi yan za zhi kan qi bian hua qing kuang

..............page:5

emc shu yu ( er )

..............page:10

wo guo guo jia yu ming .cn jin ru ipv6 shi dai

..............page:28

ding xin tui chu wo guo shou kuan wan zheng she pin ji cheng dian lu xin pian

..............page:22

shi jie shou ge xiu bu da nao xin pian wen shi

..............page:33

ji cheng dian lu zhi zao ji shu de ying yong

..............page:39

zhong guo dian zi ce liang yi qi xiang gao ji shu fa zhan

..............page:58

ce liang dang zhong de ruan jian xiu zheng fang fa

..............page:62

Role and implementation of FMEA in electronic engineering
DING Ding-hao

..............page:1-5

Application of risk management technology for design and production in weapon equiment
ZHANG Shi-jie;FENG Hong-yan;WANG Jiu-cheng

..............page:6-10

Research of prediction method of maintenance replacement rate
WANG Guo-qiang;LI Jun;YANG Bing-xi

..............page:11-15

The effect of power supply module redundancy heat backup on reliability
WEN Xiao-yun;NIU Zhong-xia;SHI Yu-jie

..............page:16-18

A new fault diagnosis technique using IDDT for CMOS IC based on wavelet analysis
JIAO Hui-fang;JIA Xin-zhang;WANG Qun-yong

..............page:19-22

The satus of international VLSI production state
ZHANG Xiao-wen;LIN Xiao-ling;RUAN Chun-lang

..............page:23-28

System-in package for RF system
CHEN Guo-hui;ZHENG Xue-ren;LIU Han-hua;ZHENG Jian

..............page:29-33

Study of particle impact noise detection (PIND)
DU Ying;LV Dong;PAN Wei-li;ZHU Wei-liang;LU Jian

..............page:34-39

Research of reliability of embeded software and its parameter for ships
JIANG Yan-kun;YU Qiang;XU Jian

..............page:40-45

Overview of Authorware design
WEI Xuan-ping;YUAN She-lao

..............page:46-49