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Electronic Product Reliability and Environmental Testing
1672-5468
2002 Issue 5
jie er xi tong gong si tui chu ye jie shou ge qian zhi fang da qi ji cheng dian lu
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page:63-63
jie er xi tong gong si tui chu di er dai payloadplus wang luo chu li qi
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page:57-57
jie er xi tong gong si wei hua shuo ke ji gong si ti gong 400 wan ultra 320 scsi kong zhi qi ic
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page:54-54
ri ben dong zhi gong si gai liang zu he ji bian si he soi de gong yi ji shu
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page:42-42
di si jie dian zi chan pin ke kao xing yu huan jing shi yan ji shu jing yan jiao liu hui tong zhi
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page:34-34
guang zhou ji cheng dian lu ce shi zhong xin jie pai
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page:30-30
yi dong tong xun fu wu gong ying shang utstarcom gong si xuan yong jie er xi tong gong si de da rong liang jiao huan xin pian
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page:21-21
zhong guo dian zi xue hui ke kao xing fen hui 2003 2004 nian gong zuo ji hua
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page:5-5
2000 International Reliability Physics Symposium(3)
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page:64-67
The safety design for power adaptor
sun jian long
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page:61-63
Improve the Quality of the Domestic Components by Destructive Physics Analysis (DPA)
xu ai bin ; liu fa
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page:58-60
A Selection of Timing Curtailed Reliability Test for Qualification with Predicted MTBF
zhu qi yue
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page:55-57
Project Management on Scientific Research
chen dong mei
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page:51-54
BGA Technology and Quality Control
xian fei
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page:46-50
Defense Electronic Business Program
cai shao ying
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page:43-45
Evaluation of Inspection or Calibration Correctness and Reliability Factor
liu chun hao
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page:39-42
Tailor Method of Thermal Cycle Screening Profile
liang xue yi
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page:35-38
Reliability Research on Conductive Function of Conductive Gold Ball
wu yong jun ; huang xiao yin ; chen qin mao
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page:31-34
The Reliability Assurance of the Product in Preproduction
shi zhi kang
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page:27-30
Discussion on Reliability Indexes of Petroleum Logging Tools
ren xiao rong ; shi yi min ; peng zuo
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page:22-26
A Practical Method on Reliability Specification Budget
wang peng ; wang xi ji
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page:18-21
Analysis of Coil Open of a Relay
zhang yan wei ; chen yan
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page:15-17
The Relationship of Failure Mechanisms and Die Sinter Process of Semiconductor Laser
huang yun ; an zhen feng
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page:11-14
The Degradation Mode and Mechanics of a Multilayer Interconnect Structure in MCM- D
he xiao zuo ; xu ai bin ; zhang xiao wen
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page:6-10
Testing on Thermal Characteristics of Pulse Power Transistor under Dynamic and DC Bias
lai ping ; he xiao zuo ; wang yin sheng ; feng jing dong ; wang zhi zuo ; niu fu lin ; fu yi zhu
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page:1-5