1672-5468
2001 Issue 1
The Development of Reliability Research on GaAs MMICs
wu hai dong ; zhuang zhi qiang ; mo yu zuo ; zhang zeng zhao ; nie guo jian
wu hai dong ; zhuang zhi qiang ; mo yu zuo ; zhang zeng zhao ; nie guo jian
..............page:29-33
The Internal Vapor Analysis for Sealed Device
chen dong mei
chen dong mei
..............page:34-39
..............page:40-45
Treatment of Interruption During Temperature Testing
song hong bo
song hong bo
..............page:46-47
Obsolescence of Electronic Part
cai shao ying
cai shao ying
..............page:25-28
Effective Management Technique for Reliability Growth
tian kai rang
tian kai rang
..............page:20-24
The Reliability Evaluation Test of Certain Type of Radar in the Coast
yang jian ; lin yue ping
yang jian ; lin yue ping
..............page:14-19
Design t1e PLAs Using DFT
zhu heng jing ; zhang zhuo
zhu heng jing ; zhang zhuo
..............page:10-13
A Model of the Weibull Life Distributions
song shi bin
song shi bin
..............page:7-9
Study of Neural Network Simulating and Extending Reliability Data
wang jin cai ; chen zhen lin ; zeng jia you
wang jin cai ; chen zhen lin ; zeng jia you
..............page:2-6