Development of Pressure Leak Calibration System
wang jinsuo1; xu hong2; hu yangli2 and tang jingyuan2 (1.shanghai jiaotong university; shanghai1; 200030; china; 2.shanghai institute of measurement and testing technology; shanghai; 200040; chin a)
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Growth and Characterization of ZnO Films by Laser Molecular Beam Epitaxy
he yongning 1*; zhu changchun1; hou xun 1; 2; 3; zhang jingwen1; yang xi aodong2; xu qing an2 and zeng fanguang1 (1.department of electronic science and technology; the school of electronic & information; xi an jiaotong university; xi an; 710049; china; 2.state key laboratory of transient optics technology; xi an institute of optics and precision mechanics; xi an; 710068; china; 3.school of physics and information optoelectronics; henan university; kaifen g; 475001; china)
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