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Chinese Journal of Semiconductors
0253-4177
2003 Issue 6
Study of ECR-Plasma Cleaning and Nitridation of Sapphire Substrate by RHEED
qin fu wen ; gu biao ; xu yin ; yang da zhi
..............page:668-672
Drying of Porous Silicon
yu xian wen ; zhu rong jin ; zhu zi qiang ; ying tao kai ; li ai zhen
..............page:663-667
Total Dose Irradiation Effects on Multi-Level Flash Memories
meng xuan hua ; yin guang qian ; gu jing ; he guo wei
..............page:656-662
Distribution of Residual Stress in Packaging Assemblies of Chip on Board
huang wei dong ; sun zhi guo ; cai xia ; luo le ; cheng zhao nian
..............page:649-655
Power and Area Efficient CMOS Clock Recovery Circuit for 10/100 Base-T Ethernet
wang yan ; ye fan ; li lian ; zheng zeng zuo
..............page:643-648
Simulation and Verification of Characteristics for Two-PolySilicon FLOTOX EEPROM Cell
huang fei hong ; zheng guo xiang ; wu rui
..............page:637-642
Study of MEMS RF Switches Array Membrane--Millimeter Wave Phase Shifter
guo fang min ; zhu zi qiang ; lai zong sheng ; zhu shou zheng ; zhu rong jin ; xin pei sheng ; fan zhong ; jia ming ; cheng zhi qun ; yang gen qing
..............page:631-636
NBTI Effect of Ultra Deep-Sub-Micron Devices
han xiao liang ; hao yue
..............page:626-630
Fabrication of Schottky Barrier Diodes of High Frequency Based on Thin Silicon Epilayer
zhang hai yan ; ye zhi zhen ; huang jing yun ; li zuo ; xie zuo hong ; zhao bing hui
..............page:622-625
Preparation of PZT/LNO Capacitor and Investigation of Its Fatigue Property
kang xiao xu ; lin yin yin ; tang ting zuo ; wang xiao guang ; zhong yu ; huang wei ning ; jiang guo bao
..............page:617-621
Ultra-Thin W-Si-N as Diffusion Barrier Layer Between Cu and Si
lu hua ; qu xin ping ; wang guang wei ; ru guo ping ; li bing zong
..............page:612-616
Two-Dimensional Electron Gas Materials with AlN/GaN Superlattice Structure Grown by Radio-Frequency Plasma-Assisted Molecular Beam Epitaxy
hu guo xin ; wang xiao liang ; sun dian zhao ; wang jun xi ; liu hong xin ; liu cheng hai ; zeng yi ping ; li jin min ; lin lan ying
..............page:602-605
Inner Gettering of Heavily-Doping Silicon for Cr
yu xue gong ; yang de ren ; ma xiang yang ; yang jian song ; zuo duan zuo
..............page:598-601
Drain and Source on Insulator MOSFETs Fabricated by Local SIMOX Technology
He Ping;Jiang Bo;Lin Xi;Liu Litian;Tian Lilin;LI Zhijian;Dong Yeming;Chen Meng;Wang Xi
..............page:592-597
A New Structure IGBT with High Performance
Cheng Xu;Wu Yu;Liu Xingming;Wang Zhe;Kang Baowei;Li Junfeng;Han Zhengsheng
..............page:586-591
Experimental Evidence of Interface-Trap-Related SILC in Ultrathin (4nm- and 2.5nm-Thick) n-MOSFET and p-MOSFET Under Hot-Carrier Stress
Yang Guoyong;Huo Zongliang;Wang Jinyan;Mao Lingfeng;Wang Ziou;Tan Changhua;Xu Mingzhen
..............page:579-585
A Novel Technology for Post-Treating of Porous Silicon Thick Films in H2O2
LONG Yongfu;Zhu Ziqiang;Lai Zongsheng
..............page:574-578
Heteroepitaxial Growth and Heterojunction Characteristics of Voids-Free n-3C-SiC on p-Si(100)
SUN Guosheng;Sun Yanling;Wang Lei;Zhao Wanshun;Luo Muchang;Zhang Yongxing;Zeng Yiping;Li Jinmin;Lin Lanying
..............page:567-573
Binding Energy and Photoionization of Hydrogenic Impurities in GaAs/Ga1-xAlxAs Quantum Well Wires
Liu Jianjun;Su Hui;Guan Ronghua;Yang Guochen
..............page:561-566