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Vacuum Science and Technology
0253-9748
2012 Issue 1
Surface Modification of Cr12MoV Steel by Depositing C-Doped TiB2 Films
Xin Xiling1;Xu Xiaojing1;Fan Zhen1;2;Tian Kun1;Chen Dan1;Yu Chunhang1;Sheng Xinlan1
..............page:15-18
Photocatalystic Property of TiO2 Films Deposited under Ambient Conditions
Liu Zhongwei;Li Sen;Chen Qiang;Wang Zhengduo;Yang Lizhen
..............page:1-5
Reduction of Laser Induced Damages of Diamond-Like-Carbon Films with External Bias
Wu Shenjiang1;2;Su Junhong2;Shi Wei1;Wang Xinmei2;Xu Junqi2
..............page:11-14
Equivalent Circuit Simulation of Double-Gap Coupled Input Cavity
Huang Chuanlu1;2;Ding Yaogen1;Wang Yong1;Xie Xingjuan1;2
..............page:39-43
Molecular Dynamics Study of Interaction between Fluorine Atoms and Silicon Surface
Zhao Chengli1;2;Deng Chaoyong2;Sun Weizhong3;Lü Xiaodan1;Chen Feng1;He Pingni1;Zhang Junyuan3;Liu Yujie3;Gou Fujun3;4;Ministry of Education;Institute of Nuclear Science and Technology;Sichuan University;Chengdu 610064;China;4.FOM Institute for Plasma Physics;3439 MN Nieuwegein;the Netherlands)
..............page:53-58
Development of Large-Sized Window of Heavy Ion Accelerator Used As Cancer Therapy Terminal
Meng Jun;Zhang Junhui;Yang Weishun;Luo Cheng;Yang Xiaotian;Ma Xiangli;Bai Feng;Guo Dizhou;Nie Zengsen;Niu Zhiwei;Lou Meiling
..............page:59-62
Enhancement of Chromatographic Resolution by Applying Differential Gas Chromatography/Mass Spectroscopy
Song Shuang;Wang Yan;Jiang Xuehui;Huang Chao
..............page:74-78
Surface Modification of AZ31 Mg Alloys by Depositing Silicon Nitrides Films
Mu Zongxin;Zang Hairong;Liu Bingbing;Lin Qu;Ding Anbang;Wang Chun;Dong Chuang
..............page:6-10
SiNx Buffer Layers and Transparence Improvement of Indium-Tin-Oxide Electrode
Liu Xiang;Xue Jianshe;Zhou Weifeng;Dai Tianming;Hao Zhaohui;Yang Jing;Ning Ce;Zhang Xuehui;Sun Bing
..............page:36-38
Mechanisms Responsible for Cracks and Overlaps of Al Films Deposited on Liquid Substrates
Yu Senjiang1;2;Zhou Man1;Jiang Weishun1;Hong Yang1;Chen Miaogen1;2
..............page:25-29
Studies of Vacuum Switching Arc at Short-Gap by Image Processing
Dong Huajun1;3;Shi Guiming2;Song Chunyu1;Wang Hongyan3;Liu Shenzhan3;Guo Yuxiang3
..............page:44-47
Microstructures and Emission Characteristics of Porous Silicon Films
Luo Wen1;Hu Wenbo1;Zheng Yu1;Song Zhongxiao2;Wu Huiyan2
..............page:30-35
Characterization of SiC/Al2O3 Interface by Synchrotron Radiation X-Ray Grazing Incident Diffraction
Liu Zhongliang1;2;Kang Chaoyang2;Tang Jun2;Chen Xiangcun2;Xu Pengshou2;Pan Guoqiang2
..............page:79-82
Reduction of Accumulated Charges on MgO Films by Adjusting Pulsed Bias
Zhu Daoyun1;2;Zheng Changxi2;Wang Mingdong2;Chen Dihu2;He Zhenhui2;Wen Lishi2
..............page:48-52